Data Sheet

Eco-View™ integrates the diagnostic power of infrared (IR) with the clarity and high resolution digital imagery of Pictometry's Electronic Field Study (EFS) image viewer. This is achieved by extracting useful information from near-IR imagery to create overlays in EFS. These overlays provide visual cues for features that may not have been apparent in standard imagery. Eco-View™ offers three basic analysis tools to help you get the most from your near-infrared imagery.

Vegetation Contour Map The Contour map produces an overlay for vegetation with different levels of response as calculated by the Normalized Difference Vegetative Index (NDVI). These contours are affected by vegetation density, chlorophyll content, stress levels, and high moisture. This analysis can be used when: Comparing relative thickness or health of vegetation Identifying potential stress areas in vegetation Identifying different types of vegetation

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Vegetation Absence Map The Absence Map produces an overlay for areas that are not covered with vegetation. Similar to the Coverage Map, you choose the threshold that discriminates between vegetative and non-vegetative areas. This is useful for: Estimating impervious surface areas Identifying man-made structures, waterways, and bare earth Locating overgrowth on marked trails and footpaths Assessing defoliation from herbicide run-off

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Vegetation Coverage Map The Coverage Map produces an overlay of areas covered with vegetation. You choose the threshold that discriminates between vegetative and non-vegetative areas. This analysis is useful for: Investigating the extents of wetland areas Identifying areas of new construction Recognizing areas experiencing vegetation loss Locating unexpected trails and footpaths

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